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Passive Intermodulation Generation on Printed Lines: Near-Field Probing and Observations
The phenomenological mechanisms of passive intermodulation
(PIM) in printed lines have been explored by mapping
intermodulation products generated by the two-tone traveling
waves in microstrip lines. Near-field probing based upon a commercial
PIM analyzer has been employed for identification of the
PIM sources in printed lines. The results of extensive near-field
probing provide the direct experimental evidences of cumulative
growth of the intermodulation products in the matched uniform
microstrip lines and reveal the fundamental role of the nonlinear
scattering by the lumped nonlinear inclusions in the intermodulation
production. The distributed nature of the PIM generation in
microstrip lines has been conclusively demonstrated and comprehensively
described in terms of the four-wave mixing process that
proved to be fully consistent with the results of experimental observations
of third-order PIM products on the matched and mismatched
microstrip lines.
Schlüsselwörter: TLX-9, four-wave mixing, near-field probing, passive Intermodulation (PIM), Leiterplatten-Materialcharakterisierung, printed circuit board (pcb) material characterization, printed circuits
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